Ion-tofジャパン

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August undefined, 2024

Web29 mrt. 2016 · ToF-SIMS spectra were obtained with a ToF-SIMS V (ION-TOF GmbH, Germany) equipped with a 25 keV Bi 3+ ion gun. For the ToF-SIMS spectrum, the ion gun was operated at 8.3 kHz with an average current of 0.28 pA (Bi 3+) at the sample holder. A bunch pulse of 0.7 ns duration resulted in mass resolution (M/ M) > 8000 at m/z 760. Web25 okt. 2011 · The use of polyatomic ion sources in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has recently been developed, promising the enhancement of molecular ion yields and therefore an increase in instrument sensitivity [1–3].Compared with monatomic projectiles of comparable mass and energy, polyatomic projectiles lead to …

飞行时间二次离子质谱仪-清华大学分析中心

WebTOF.SIMS NCS (Combined AFM System) Hybrid TOF.SIMS (Combined Q Exactive TM) F GmbH : T im 設置スペース3,500x3,500x2,600H 本体2,500x1,700x2,100H 総重 … WebOverview. The IONICON ioniAPi-TOF is a modular and robust Time-of-Flight mass spectrometer designed for the detection and mass analysis of ions generated at … irm remicourt

World’s Fastest Q-TOF Mass Spectrometer Capable of …

WebTime of flight ( ToF) is the measurement of the time taken by an object, particle or wave (be it acoustic, electromagnetic, etc.) to travel a distance through a medium. This information can then be used to measure velocity or path length, or as a way to learn about the particle or medium's properties (such as composition or flow rate). Web4 okt. 2024 · As an IMS technology, time-of-flight–secondary ion mass spectrometry (TOF–SIMS) provides both mass spectra (chemical information) and ion images (spatial information) for biomolecules on ... Web18 feb. 2016 · Conventionally, ToF-SIMS measurements rely on signal averaging (SA) over multiple experimental cycles to maximise the signal-to-noise ratio and resulting sensitivity. Each cycle consists of a short (nanosecond) primary ion pulse, followed by the measurement of the flight time (up to 0.2 milliseconds) of secondary ions, ejected from … irm referti online

Ion Torrent Thermo Fisher Scientific - JP

Time-of-flight secondary ion mass spectrometry fragment

WebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis Web9 sep. 2010 · Time of flight-secondary ion mass spectrometry (TOF-SIMS) is based on the acceleration of high-energy primary ions onto a target. Secondary electrons, neutrals and ions are emitted from the target reflecting its chemical composition, making possible simultaneous analysis and localization of a plethora of target molecules at submicron … port hope police chiefWebFor each citation that was shared on social media (LinkedIn, Facebook, or Twitter) with the “@GenScript” tag, the author will be rewarded with a $10 Amazon gift card or 2,000 GS … irm refund litigation

"Webtof-simsは，大きく分けると一次イオン源，超高真空試料チャンバー，飛行時間型質量分析計から構成される。装置の概観とその構造の一例（ion-tof社tof.sims5，以下の説明に … " - Ion-tofジャパン

Ion-tofジャパン

WebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry … Web20 feb. 2013 · Oxygen isotope exchange with subsequent time-of-flight secondary ion mass spectrometry ( ToF-SIMS) is a highly valuable tool for determining oxygen diffusion coefficients in oxides.

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Web9 feb. 2016 · The popularity of argon gas cluster ion beams (Ar-GCIB) as primary ion beams in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has increased because the molecular ions of large organic- and biomolecules can be detected with less damage to the sample surfaces. WebTime-of-flight secondary ion mass spectrometry (TOF-SIMS) utilizing static SIMS provides a variety of secondary ions, including molecule-related ions and fragment ions, which are useful for investigating the chemical structures of sample surfaces. However, the spectra of a complex sample obtained from TOF-SIMS are often difficult to interpret.

WebExplore our range of products, from complete instruments to our range of ion beams, imaging systems, electron beams, and peripherals. WebIONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis ウェブサイト …

Webサイトの利用条件; 個人情報保護に関して © Hitachi High-Tech Science Corporation. 2003, 2024. All rights reserved. WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis About IONTOF Data & Facts Vision

Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering …

Web飛行時間型二次イオン質量分析(TOF-SIMS：Time-of-Flight Secondary Ion Mass Spectrometry)はパルス状の一次イオンビームを試料に照射し、試料から発生する二次 … port hope police media releaseWebD-803i ION TRAP REFLECTRON POWER SUPPLY. Size (approximately), rack mounted. 19"W x 5.25"H x 14.5"D. Input voltage (power requirements) 100/120/220/240, 50/60 Hz. … irm rethelWebIONOPTIKA社（英国）はイオンビームの専門技術の会社として25年以上活動して参りました。お客様の要望に合った、特徴のある各種のイオン銃やSIMS（二次イオン質量分析 … irm refund offsetWeb29 jun. 2014 · We present a comparative study of the time-of-flight-secondary ion mass spectrometry (ToF-SIMS), Fourier transform infrared (FT-IR) spectroscopy and X-ray photoelectron spectroscopy (XPS) techniques on a mixed self-assembled monolayer (SAM) of biotinylated polyethylene glycol alkane thiol (BPT) and 11-mercaptoundecanol (MUD) … port hope physiotherapyWebIONTOFジャパン株式会社 Your NEW Partner for Surface Analysis 2024年4月始動！ M6 - SIMS technology one step ahead M6 は、IONTOF社が提案する最新世代の TOF-SIMS … irm reply allWeb14 jul. 2024 · IONTOFジャパン株式会社（イオントフジャパン）は、法人番号:3010401161478で神奈川県横浜市緑区白山1丁目18番2号に所在する法人として東京法 … irm refund claimWeb14 jul. 2010 · Energy deposition by high-intensity pulsed ion beam into a metal target has been studied with time-of-flight (TOF) of ions which can be related to the original ion kinetic energy E 0 and the ion mass with .It is found that the TOF effect has a profound influence on the kinetic energy distribution of implanted ions and subsequent energy deposition … irm reveal